THE PLATFORM: easy-to-use, intuitive platform that allows users to visualize results and further explore data/anomalies of interest found by our time-series and image analysis algorithms. Users can look at individual products or overall batch/lot performance.
AI CAPABILITIES: robust algorithms for X-ray, SEM, and optical microscopy analysis, that are able to identify and measure material features, such as voids in weld and braze joints and cell microstructure
unsupervised learning model to identify and characterize time-series data in applications like battery cycling and vehicle operational data.
HARDWARE: in-line optical microscopy system to evaluate microstructure of a surface.